EM'2008 XIII International Conference on Electron Microscopy

The scope of the EM'2008 is to provide an overview of present achievements in electron microscopy and to highlight recent applications in physics, chemistry, materials science and live science. The scientific program contains sessions:

A. Theoretical and Instrumental Advances
of Various Microscopy Techniques:

Basic TEM, Imaging, Electron diffraction, CBED, High Resolution TEM, Practical Applications of High Resolution TEM, Quantitative HRTEM, Image Simulation, Image processing, EELS, Practical Applications of EELS/EFTEM, Electron Tomography, Aberration Corrected STEM, Image Processing and Optical Technology, Electron Backscatter Diffraction, SEM and X-ray Microanalysis.

B. TEM and SEM Applications in Material Science:

Metals, Alloys, Intermetallics, Sintered Materials, Ceramics, Nanomaterials, Semiconductor Materials, Functional Materials, Thin Films and Coatings, Layered Structures and Interfaces, Powders, Joints and Welds, Micro and Nanochemistry, Geomaterials, Analytical Electron Microscopy at the Micro and Nanometer Scale, Cryo-SEM, variable-pressure SEM.

C. Specimen Preparation Techniques:

Sample preparation techniques: replicas, chemical and electrochemical polishing, ion milling, FIB of different materials including: Metals, Alloys, Ceramics, Particles, Thin films and Composite Materials, Microtom technique.

D. Life Sciences:

SEM, TEM and VPSEM Applications, Microscopy in biomedicine, Confocal & Optical Microscopy